25Years Innovation and Quality

Solutions from Itabashi factory

Since the establishment of the company, we have provided technical capabilities of
Optical measurement and Spectroscopic measurement for IR/UV/VIS.
Supplies a variety of integrated accessories, and offered technical support.

PRODUCTS

We can ship worldwide following products we manufactured

DCCplus_DCC2

DCCplus_DCC2

Have you ever experienced …
the sample you struggled hard to pick up has moved
away during compression?

ENG_Heated_and_SealedGG

ENG_Heated_and_SealedGG

In-situ FT-IR analysis of anaerobic Lithium Ion Battery
electrode interface.
• Top-plate can easily be taken off and brought into
glove box.
• Inside the glove box, sample is put onto ATR crystal
and sealed inside the small chamber above the crystal.
• Top-plate is safely brought back to spectrometer with
anaerobic sample sealed inside.

GoldenEyeIII-1

GoldenEyeIII-1

High-spec Integrating sphere that can be mounted in
FT-IR spectrometer sample chamber

Heating_and_Cooling_Stage

Heating_and_Cooling_Stage

Three types of heating and heating/cooling stage to suit your need.
Fits on sample compartment of most FT-IR models.

SBIR_SBIR-Plus

SBIR_SBIR-Plus

SuperBlack IR is a light absorbing suede film made of polyurethane resin and having abrasion
resistance.

SEIRAS_Cell_and_Unit

SEIRAS_Cell_and_Unit

SEIRAS Electrolysis Cell and Optical Unit

SE50A-ECO 300SFE

SE50A-ECO 300SFE

S y s t e m s E n g i n e e r i n g c o m b i n e s
the Thermo Fisher Scientific FT-IR
measurement technology and JEL's edge
grip wafer handling system to introduce
a new generation "FT-IR SE-50 series"
semiconductor material characterization
tools.

SE50A_ECO 200DS

SE50A_ECO 200DS

Systems Engineering combines the Thermo
Fisher Scientific FT-IR measurement
technology and JEL's wafer handling
system to introduce a new generation
"FT-IR SE-50 series" semiconductor
material characterization tools.

SE50A_ECO 200SMIF

SE50A_ECO 200SMIF

Systems Engineering combines the Thermo
Fisher Scientific FT-IR measurement
technology and JEL's Sorter System to
introduce a new generation
"FT-IR SE-50 series" semiconductor
material characterization tools.

SE50S-ECO-02S-1

SE50S-ECO-02S-1

Systems Engineering combines the Thermo
Fisher Scientific FT-IR measurement
technology and Single wafer handling
system to introduce a new generation
"FT-IR SE-50 series" semiconductor
material characterization tools.

OCT System

OCT System

Non destructive and non contact tomographic imaging of
samples.
No radiation effect using infrared light.
High resolution 2D & 3D tomographic imaging.
High speed scan of the laser enables real time 2D display and
a 3D image can be acquired within a few seconds.

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