PRODUCTS
We can ship worldwide following products we manufactured
DCCplus_DCC2
Have you ever experienced …
the sample you struggled hard to pick up has moved
away during compression?
ENG_Heated_and_SealedGG
In-situ FT-IR analysis of anaerobic Lithium Ion Battery
electrode interface.
• Top-plate can easily be taken off and brought into
glove box.
• Inside the glove box, sample is put onto ATR crystal
and sealed inside the small chamber above the crystal.
• Top-plate is safely brought back to spectrometer with
anaerobic sample sealed inside.
GoldenEyeIII-1
High-spec Integrating sphere that can be mounted in
FT-IR spectrometer sample chamber
Heating_and_Cooling_Stage
Three types of heating and heating/cooling stage to suit your need.
Fits on sample compartment of most FT-IR models.
SBIR_SBIR-Plus
SuperBlack IR is a light absorbing suede film made of polyurethane resin and having abrasion
resistance.
NIEKA
Perfect for ICP and XRF sample preparation.
Full temperature range for no-compromise methods.
SE50A-ECO 300SFE
S y s t e m s E n g i n e e r i n g c o m b i n e s
the Thermo Fisher Scientific FT-IR
measurement technology and JEL's edge
grip wafer handling system to introduce
a new generation "FT-IR SE-50 series"
semiconductor material characterization
tools.
SE50A_ECO 200DS
Systems Engineering combines the Thermo
Fisher Scientific FT-IR measurement
technology and JEL's wafer handling
system to introduce a new generation
"FT-IR SE-50 series" semiconductor
material characterization tools.
SE50A_ECO 200SMIF
Systems Engineering combines the Thermo
Fisher Scientific FT-IR measurement
technology and JEL's Sorter System to
introduce a new generation
"FT-IR SE-50 series" semiconductor
material characterization tools.
SE50S-ECO-02S-1
Systems Engineering combines the Thermo
Fisher Scientific FT-IR measurement
technology and Single wafer handling
system to introduce a new generation
"FT-IR SE-50 series" semiconductor
material characterization tools.
OCT System
Non destructive and non contact tomographic imaging of
samples.
No radiation effect using infrared light.
High resolution 2D & 3D tomographic imaging.
High speed scan of the laser enables real time 2D display and
a 3D image can be acquired within a few seconds.
